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[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Challenges of Reliability Assessment and Enhancement in Autonomous Systems

[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Challenges of Reliability Assessment and Enhancement in Autonomous Systems

Jenihhin, Maksim; Reorda, Matteo Sonza; Balakrishnan, Aneesh; Alexandrescu, Dan
  • 作者Jenihhin, Maksim; Reorda, Matteo Sonza; Balakrishnan, Aneesh; Alexandrescu, Dan
  • 文件大小584.04KB
  • 发表时间2019
  • DOI10.1109/dft.2019.8875379
  • 页码1-6
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