Drain-Extended FinFET With Embedded SCR (DeFinFET-SCR) for High-Voltage ESD Protection and Self-Protected Designs

• 期刊名称IEEE Transactions on Electron Devices
• 作者Paul, Milova; Sampath Kumar, B.; Karmel Nagothu, Kranthi; Singhal, Pulkit; Gossner, Harald; Shrivastava, Mayank
• 卷第66卷
• 期第12期
• 印刷ISSN0018-9383
• 电子ISSN1557-9646
• 文件大小2435.25KB
• 发表时间2019-12
• DOI10.1109/ted.2019.2949126
• 页码5072-5079