[IEEE 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Barcelona, Spain (2019.9.2-2019.9.6)] 2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Comparison of voltages induced in an electronic equipment during far field and near field normative radiated immunity tests
Durier, Andre; Dhia, Sonia Ben; Dubois, Tristan
- 作者Durier, Andre; Dhia, Sonia Ben; Dubois, Tristan
- 文件大小2178.08KB
- 发表时间2019
- DOI10.1109/EMCEurope.2019.8871798
- 页码938-943