[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR)
Enyedi, Szilard; Miclea, Liviu
- 作者Enyedi, Szilard; Miclea, Liviu
- 文件大小782.19KB
- 发表时间2019
- DOI10.1109/ITC44170.2019.9000144
- 页码1-4