[IEEE 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - Nashville, TN, USA (2019.11.3-2019.11.6)] 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS) - Ballast Resistor Temperature Effect and Ruggedness
Ngu, Yves; Gebreselasie, Ephrem; Krishnasamy, Rajendran; Rassel, Rick
- 作者Ngu, Yves; Gebreselasie, Ephrem; Krishnasamy, Rajendran; Rassel, Rick
- 文件大小1618.48KB
- 发表时间2019
- DOI10.1109/bcicts45179.2019.8972747
- 页码1-4