[IEEE 2019 IEEE International Test Conference India (ITC India) - Bangalore, India (2019.7.21-2019.7.23)] 2019 IEEE International Test Conference India (ITC India) - Hybrid emulation approach in ISO 26262 compliant unit test process
Alluri, Narendra Varma; Sykam, Pradeep Reddy; Narayanaswamy, Harish
- 作者Alluri, Narendra Varma; Sykam, Pradeep Reddy; Narayanaswamy, Harish
- 文件大小2071.11KB
- 发表时间2019
- DOI10.1109/itcindia46717.2019.8979727
- 页码1-7