[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Applications of Hierarchical Test

• 作者Ockunzzi, Kelly; Grupp, Richard; Keller, Brion; Taylor, Mark; Pai, Sreekanth; Jayakumar, Greeshma
• 文件大小3808.12KB
• 发表时间2019
• DOI10.1109/itc44170.2019.9000156
• 页码1-6