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A two-level Bayesian early fault detection for mechanical equipment subject to dependent failure modes

A two-level Bayesian early fault detection for mechanical equipment subject to dependent failure modes

Duan, Chaoqun; Makis, Viliam; Deng, Chao
  • 期刊名称Reliability Engineering & System Safety
  • 作者Duan, Chaoqun; Makis, Viliam; Deng, Chao
  • 卷第193卷
  • 印刷ISSN0951-8320
  • 文件大小3344.53KB
  • 发表时间2020-01
  • DOI10.1016/j.ress.2019.106676
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