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A Practical On-board SiC MOSFET Condition Monitoring Technique for Aging Detection

A Practical On-board SiC MOSFET Condition Monitoring Technique for Aging Detection

Pu, Shi; Yang, Fei; Vankayalapati, Bhanu; Ugur, Enes; Xu, Chi; Akin, Bilal
  • 期刊名称IEEE Transactions on Industry Applications
  • 作者Pu, Shi; Yang, Fei; Vankayalapati, Bhanu; Ugur, Enes; Xu, Chi; Akin, Bilal
  • 印刷ISSN0093-9994
  • 电子ISSN1939-9367
  • 文件大小2625.43KB
  • 发表时间2020
  • DOI10.1109/TIA.2020.2980220
  • 页码1-1
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