Can government official visits actually help young technology enterprises?
Zhang, Liang; Zhang, Zhe; Ren, Yeyao; Jia, Ming
- 期刊名称IEEE Engineering Management Review
- 作者Zhang, Liang; Zhang, Zhe; Ren, Yeyao; Jia, Ming
- 印刷ISSN0360-8581
- 电子ISSN1937-4178
- 文件大小1473.58KB
- 发表时间2020
- DOI10.1109/emr.2020.2971602
- 页码1-1