An Empirical Study of Model-Agnostic Techniques for Defect Prediction Models
Jiarpakdee, Jirayus; Tantithamthavorn, Chakkrit; Dam, Hoa Khanh; Grundy, John
- 期刊名称IEEE Transactions on Software Engineering
- 作者Jiarpakdee, Jirayus; Tantithamthavorn, Chakkrit; Dam, Hoa Khanh; Grundy, John
- 印刷ISSN0098-5589
- 电子ISSN1939-3520
- 文件大小897.53KB
- 发表时间2020
- DOI10.1109/tse.2020.2982385
- 页码1-1