Hot-Hole
versus
Hot-Electron Transport at Cu/GaN Heterojunction Interfaces
Tagliabue, Giulia; DuChene, Joseph S.; Habib, Adela; Sundararaman, Ravishankar; Atwater, Harry A.
- 期刊名称ACS Nano
- 作者Tagliabue, Giulia; DuChene, Joseph S.; Habib, Adela; Sundararaman, Ravishankar; Atwater, Harry A.
- 印刷ISSN1936-0851
- 电子ISSN1936-086X
- 文件大小881.34KB
- 发表时间2020-04-27
- DOI10.1021/acsnano.0c00713