Systematic study of the etching characteristics of Si{111} in modified TMAH
Swarnalatha, Veerla; Pal, Prem; Pandey, Ashok Kumar; Narasimha Rao, Avvaru Venkata; Xing, Yan; Tanaka, Hiroshi; Sato, Kazuo
- 期刊名称Micro & Nano Letters
- 作者Swarnalatha, Veerla; Pal, Prem; Pandey, Ashok Kumar; Narasimha Rao, Avvaru Venkata; Xing, Yan; Tanaka, Hiroshi; Sato, Kazuo
- 卷第15卷
- 期第1期
- 电子ISSN1750-0443
- 文件大小744.00KB
- 发表时间2020-01-15
- DOI10.1049/mnl.2019.0443
- 页码52-57