福建省银行季刊 第2卷 第1-3期
- 作者福建省银行总行经济研究室编
- 出版社福建省银行总行
- 标注页数393 页
- 文件页数401 页
- 文件大小69.21 MB
- 出版时间1935
MEMS Reliability ReviewHuang, Yunhan; Sai Sarathi Vasan, Arvind; Doraiswami, Ravi; Osterman, Michael; Pecht, Michael · IEEE Transactions on Device and Materials Reliability · 2012
Design for soft error mitigationNicolaidis, M. · IEEE Transactions on Device and Materials Reliability · 2005
ErratumBrennan, Claire; Draksharapu, Apparao; Browne, Wesley R.; McGarvey, John J.; Vos, Johannes G.; Pryce, Mary T. · IEEE Transactions on Device and Materials Reliability · 2005
Fuse Regrowth KineticsLambert, D.; Gannamani, R.; Blish, R.C. · IEEE Transactions on Device and Materials Reliability · 2004
Author's replyMiranda, E. · IEEE Transactions on Device and Materials Reliability · 2006
Timing Vulnerability Factors of SequentialsSeifert, N.; Tam, N. · IEEE Transactions on Device and Materials Reliability · 2004
Popcorn Cavity PressureShirley, C. Glenn · IEEE Transactions on Device and Materials Reliability · 2014
Device ArchitectureTao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob · IEEE Transactions on Device and Materials Reliability · 2007