![[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Finite aperture time effects in sampling circuit]()
[IEEE 2015 IEEE 11th International Conference on ASIC (ASICON ) - Chengdu, China (2015.11.3-2015.11.6)] 2015 IEEE 11th International Conference on ASIC (ASICON) - Finite aperture time effects in sampling circuitArai, Miho; Shimizu, Isao; Kobayashi, Haruo; Kurihara, Keita; Sasaki, Shu; Shibuya, Shohei; Niitsu, Kiichi; Kubo, Kazuyoshi · 2015