国际经济学
- 作者陈伟，陈恒，翟立强主编
- 出版社哈尔滨：哈尔滨工程大学出版社
- 标注页数196 页
- 文件页数203 页
- 文件大小58.52 MB
- 出版时间2015
- ISBN9787566110411
MEMS Reliability ReviewHuang, Yunhan; Sai Sarathi Vasan, Arvind; Doraiswami, Ravi; Osterman, Michael; Pecht, Michael · IEEE Transactions on Device and Materials Reliability · 2012
Design for soft error mitigationNicolaidis, M. · IEEE Transactions on Device and Materials Reliability · 2005
ErratumBrennan, Claire; Draksharapu, Apparao; Browne, Wesley R.; McGarvey, John J.; Vos, Johannes G.; Pryce, Mary T. · IEEE Transactions on Device and Materials Reliability · 2005
Fuse Regrowth KineticsLambert, D.; Gannamani, R.; Blish, R.C. · IEEE Transactions on Device and Materials Reliability · 2004
Author's replyMiranda, E. · IEEE Transactions on Device and Materials Reliability · 2006
Timing Vulnerability Factors of SequentialsSeifert, N.; Tam, N. · IEEE Transactions on Device and Materials Reliability · 2004
Popcorn Cavity PressureShirley, C. Glenn · IEEE Transactions on Device and Materials Reliability · 2014
Device ArchitectureTao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob · IEEE Transactions on Device and Materials Reliability · 2007