![[IEEE 2010 23rd IEEE ICMTS International Conference on Microelectronic Test Structures (ICMTS 2010) - Hiroshima (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Investigation on the field leakage current in 0.35μm CMOS technology at high temperature]()
[IEEE 2010 23rd IEEE ICMTS International Conference on Microelectronic Test Structures (ICMTS 2010) - Hiroshima (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Investigation on the field leakage current in 0.35μm CMOS technology at high temperatureSoon Tat Kong, ; Ronald, Paul Stribley; Lee, Chris · 2010