![SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review - Survey of standards for image telecommunications]()
SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review - Survey of standards for image telecommunicationsUrban, Stephen · 2017