Superconducting titanium-molybdenum alloys
- 作者R.D. Blaugher; B.S. Chandrasekhar; J.K. Hulm; E. Corenzwit; B.T. Matthias
- 卷第21卷
- 印刷ISSN0022-3697
- 文件大小342.51KB
- 发表时间1961
- DOI10.1016/0022-3697(61)90104-4
- 页码252-255
Pair correlations in solid lead near the melting temperatureRoy Kaplow; B.L. Averbach; S.L. Strong · 1964
Pair correlations in solid lead near the melting temperatureRoy Kaplow; B.L. Averbach; S.L. Strong · 1964
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[IEEE Proceedings of IEEE International Reliability Physics Symposium - Atlanta, GA, USA (1993.03.23-1993.03.25)] 31st Annual Proceedings Reliability Physics 1993 - Gate dielectric integrity and reliability in 0.5- mu m CMOS technologyStrong, A.W.; Stamper, A.K.; Bolam, R.J.; Furukawa, T.; Gow, C.J.; Gow, T.R.; Martin, D.W.; Mittl, S.W.; Nakos, J.S.; Pennington, S.L. · 1993