Characterization of quality of Ba[sub x]Sr[sub 1−x]TiO[sub 3] thin film by the commutation quality factor measured at microwavesRazumov, S. V.; Tumarkin, A. V.; Gaidukov, M. M.; Gagarin, A. G.; Kozyrev, A. B.; Vendik, O. G.; Ivanov, A. V.; Buslov, O. U.; Keys, V. N.; Sengupta, L. C.; Zhang, X. · Applied Physics Letters · 2002