![SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometer]()
SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Study of the measurement of solution concentration by surface plasmon resonance heterodyne interferometerChen, Kun-Huang; Lehmann, Peter H.; Chen, Jing-Heng; Lin, Jiun-You; Chang, Wei-Yao; Hsieh, Hsiang-Yung · 2009