Boekbesprekings/Book reviews
- 期刊名称Politikon
- 作者Timmermans, D.J.J.; Merwe, C.J. Van Der; Venter, T.D.; Mulder, E.
- 卷第1卷
- 期第1期
- 印刷ISSN0258-9346
- 电子ISSN1470-1014
- 文件大小411.47KB
- 发表时间1974-06
- DOI10.1080/02589347408704660
- 页码86-90
MEMS Reliability ReviewHuang, Yunhan; Sai Sarathi Vasan, Arvind; Doraiswami, Ravi; Osterman, Michael; Pecht, Michael · IEEE Transactions on Device and Materials Reliability · 2012
Design for soft error mitigationNicolaidis, M. · IEEE Transactions on Device and Materials Reliability · 2005
ErratumBrennan, Claire; Draksharapu, Apparao; Browne, Wesley R.; McGarvey, John J.; Vos, Johannes G.; Pryce, Mary T. · IEEE Transactions on Device and Materials Reliability · 2005
Fuse Regrowth KineticsLambert, D.; Gannamani, R.; Blish, R.C. · IEEE Transactions on Device and Materials Reliability · 2004
Author's replyMiranda, E. · IEEE Transactions on Device and Materials Reliability · 2006
Timing Vulnerability Factors of SequentialsSeifert, N.; Tam, N. · IEEE Transactions on Device and Materials Reliability · 2004
Popcorn Cavity PressureShirley, C. Glenn · IEEE Transactions on Device and Materials Reliability · 2014
Device ArchitectureTao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob · IEEE Transactions on Device and Materials Reliability · 2007