Reliability of Binary Attribute Data
- 期刊名称Biometrics
- 作者Klaus Krippendorff and Joseph L. Fleiss
- 卷第34卷
- 期第1期
- 印刷ISSN0006-341X
- 电子ISSN1541-0420
- 文件大小354.77KB
- 发表时间1978-03
- DOI10.2307/2529602
- 页码142-144
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