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Memory characteristics of Al2O3/LaAlO3/SiO2multilayer structures with tunnel oxide thickness variationSeung-Yong Cha; Hyo-June Kim; Doo-Jin Choi · 2010
Memory characteristics of Al2O3/La2O3/Al2O3 multi-layer films with various blocking and tunnel oxide thicknessesHyo June Kim; Seung Yong Cha; Doo Jin Choi · 2010
[IEEE 2010 IEEE 3rd International Nanoelectronics Conference (INEC) - Hong Kong, China (2010.01.3-2010.01.8)] 2010 3rd International Nanoelectronics Conference (INEC) - Memory characteristics of multilayer structures with lanthanum-aluminate charge trap by fowler-nordheim tunnelingSeung-Yong Cha, ; Hyo-June Kim, ; Doo-Jin Choi, · 2010
PrefaceJournal of the Ceramic Society of Japan · 2014
ContentsJournal of the Ceramic Society of Japan · 2015
CoverJournal of the Ceramic Society of Japan · 2015