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Assessment of defects in as-grown III-V multilayer structures by differentiated cathodoluminescence topography (DCLT)

Assessment of defects in as-grown III-V multilayer structures by differentiated cathodoluminescence topography (DCLT)

J. Bakker; J. de Poorter; W. J. Bartels; T. v. Dongen; W. Nijman; W. T. Stacy

作者J. Bakker; J. de Poorter; W. J. Bartels; T. v. Dongen; W. Nijman; W. T. Stacy
卷第9卷
期第2期
印刷ISSN0361-5235
电子ISSN1543-186X
文件大小4627.24KB
发表时间1980-03
DOI10.1007/bf02670852
页码311-334

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