Evaluation of EMP Failure Models for Discrete Semiconductor Devices
- 作者Shoup, R. W.; Hanson, R. J.; Durgin, D. L.
- 卷第28卷
- 期第6期
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小1299.80KB
- 发表时间1981
- DOI10.1109/tns.1981.4335724
- 页码4328-4333
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