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Some remarks on void growth in thin silver filmsJ.R. Lloyd; S. Nakahara · 1982
A diffusive creep model for electromigration-induced damageJ.R. Lloyd; S. Nakahara · 1981
A room temperature interdiffusion study in a gold/lead thin film coupleJ.R. Lloyd; S. Nakahara · 1978
Low temperature void growth and resistivity decay in thin evaporated gold filmsJ.R. Lloyd; S. Nakahara · 1977
Grain boundary and vacancy diffusion model for electromigration-induced damage in thin film conductorsJ.R. Lloyd; S. Nakahara · 1980
The effect of high d.c. density stressing on pre-existing voids in thin gold filmsJ.R. Lloyd; S. Nakahara · 1979