Prototype Debug using ATE
- 期刊名称IEEE Design & Test of Computers
- 作者Florcik, David; Low, David; Roche, Martin
- 卷第1卷
- 期第2期
- 印刷ISSN0740-7475
- 文件大小4602.42KB
- 发表时间1984-05
- DOI10.1109/mdt.1984.5005619
- 页码94-99
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