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High Resolution Transmission Electron Microscopy of Defects in High
<i>T</i>
<sub/>c</sub>
Superconductor Ba
<sub/>2</sub>
YCu
<sub/>3</sub>
O
<sub/><i>y</i>
</sub>

High Resolution Transmission Electron Microscopy of Defects in High T _c Superconductor Ba ₂ YCu ₃ O _y

Matsui, Yoshio; Takayama-Muromachi, Eiji; Ono, Akira; Horiuchi, Shigeo; Kato, Katsuo

期刊名称Japanese Journal of Applied Physics
作者Matsui, Yoshio; Takayama-Muromachi, Eiji; Ono, Akira; Horiuchi, Shigeo; Kato, Katsuo
卷第26卷
印刷ISSN0021-4922
文件大小1358.01KB
发表时间1987-5-20
DOI10.1143/JJAP.26.L777

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