Ultra trace analysis of refractory metals by solid state mass spectrometry — A comparison of GDMS, SSMS and SIMS
- 作者Norbert Jakubowski; Dietmar Stuewer; Wojciech Vieth
- 卷第91卷
- 印刷ISSN0026-3672
- 电子ISSN1436-5073
- 文件大小900.99KB
- 发表时间1987
- DOI10.1007/bf01199506
- 页码302-308
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