[WORLD SCIENTIFIC Proceedings of the International School on Crystal Growth and Characterization of Advanced Materials - La Habana, Cuba (30 Nov–10 Dec 1987)] Crystal Growth and Characterization of Advanced Materials - SILICON-MBE AND MICROELECTRONICS
- 作者Zehe, Alfred
- 文件大小468.48KB
- 发表时间1988
- DOI10.1142/9789814541589_0015
- 页码335-357
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