SPIE Proceedings [SPIE Wuhan 91 - Wuhan (Wednesday 9 October 1991)] International Conference on Optical Fibre Sensors in China OFS(C) '91 - Special optical fibers for sensors
- 作者Inada, Koichi; Culshaw, Brian; Liao, Yanbiao
- 卷第1572卷
- 印刷ISSN0277-786X
- 文件大小302.61KB
- 发表时间1991
- DOI10.1117/12.50029
- 页码163-168
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Modeling Aspects in Optical Metrology III - Front Matter: Volume 8083SPIE, Proceedings of; Bodermann, Bernd · 2011
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Modeling Aspects in Optical Metrology V - Propagation invariant laser beams for optical metrology applicationsBodermann, Bernd; Frenner, Karsten; Silver, Richard M.; Soskind, M.; Soskind, Y. G. · 2015
SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Modeling Aspects in Optical Metrology V - Front Matter: Volume 9526Bodermann, Bernd; Frenner, Karsten; Silver, Richard M.; SPIE, Proceedings of · 2015
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Front Matter: Volume 8789SPIE, Proceedings of; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Modeling Aspects in Optical Metrology II - Front Matter: Volume 7390SPIE, Proceedings of; Bosse, Harald; Bodermann, Bernd; Silver, Richard M. · 2009
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - Front Matter: Volume 6617SPIE, Proceedings of; Bosse, Harald; Bodermann, Bernd; Silver, Richard M. · 2007
SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Modeling Aspects in Optical Metrology II - Assistance system for optical sensorsSchmitt, R.; Bosse, Harald; Bodermann, Bernd; Koerfer, F.; Seewig, J.; Silver, Richard M.; Osten, W.; Weckenmann, A. · 2009
SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 18 June 2007)] Modeling Aspects in Optical Metrology - <title>Enhancements to FDTD modeling for optical metrology applications</title>Salski, Bartlomiej; Celuch, Malgorzata; Gwarek, Wojciech; Bosse, Harald; Bodermann, Bernd; Silver, Richard M. · 2007