SPIE Proceedings [SPIE Shanghai - DL tentative - Shanghai, China (Monday 1 April 1991)] International Conference on Thin Film Physics and Applications - High-field electron trapping and detrapping characteristics in thin SiOxNy films
Yang, Bing L.; Liu, Bai Y.; Cheng, Y. C.; Wong, HonLeung K.; Zhou, Shixun; Wang, Yongling
- 作者Yang, Bing L.; Liu, Bai Y.; Cheng, Y. C.; Wong, HonLeung K.; Zhou, Shixun; Wang, Yongling
- 卷第1519卷
- 印刷ISSN0277-786X
- 文件大小279.77KB
- 发表时间1991
- DOI10.1117/12.47267
- 页码241-246