Properties of r.f. sputtered niobium thin films for metrological applications
- 作者D. Andreone; V. Lacquaniti; S. Maggi; E. Monticone; R. Steni; F. Taiariol
- 卷第1卷
- 印刷ISSN0964-1807
- 文件大小667.72KB
- 发表时间1993
- DOI10.1016/0964-1807(93)90440-d
- 页码1333-1340
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