Plasma-polymerized films of trimethylsilane deposited on cold-rolled steel substrates. Part 1. Characterization by XPS, AES and TOF-SIMS
- 作者A. Sabata; W. J. van Ooij; H. K. Yasuda
- 卷第20卷
- 期第10期
- 印刷ISSN0142-2421
- 电子ISSN1096-9918
- 文件大小1050.29KB
- 发表时间1993
- DOI10.1002/sia.740201008
- 页码845-859
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Plasma-polymerized films of trimethylsilane deposited on cold-rolled steel substrates. Part 1. Characterization by XPS, AES and TOF-SIMSA. Sabata; W. J. van Ooij; H. K. Yasuda · 1993