SPICE analysis of the SEU sensitivity of a fully depleted SOI CMOS SRAM cell
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Alles, M.L.
- 卷第41卷
- 期第6期
- 印刷ISSN0018-9499
- 文件大小447.83KB
- 发表时间1994-12
- DOI10.1109/23.340547
- 页码2093-2097
[IEEE INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, USA (2006.05.8-2006.05.12)] INTERMAG 2006 - IEEE International Magnetics Conference - Withdrawn2006
[IEEE INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, USA (2006.05.8-2006.05.12)] INTERMAG 2006 - IEEE International Magnetics Conference - Withdrawn2006
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