海量图书期刊资源,随时随地畅享阅读乐趣
Absolute lattice parameter measurementP. F. Fewster · 1999
Applications of multiple-crystal diffractometryP. F. Fewster; N. L. Andrew · 1995
Interpretation of the diffraction profile resulting from strain relaxation in epilayersP. Kidd; P. F. Fewster; N. L. Andrew · 1995
Measurement of 'material' parameters in multi-quantum-well structuresJ. W. Orton; P. F. Fewster; J. P. Gowers; P. Dawson; K. J. Moore; P. J. Dobson; C. J. Curling; C. T. Foxon; K. Woodbridge; G. Duggan; H. I. Ralph · 1987
Measuring strain in polycrystalline CVD diamond filmsM. Golshan; D. Laundy; P. F. Fewster; M. Moore; A. Whitehead; J. E. Butler; O. Konovalov · 2003
Three-dimensional reciprocal-space mapping of chemical vapour deposited diamondM. Golshan; P. F. Fewster; N. L. Andrew; P. Kidd; M. Moore; J. E. Butler · 2001
High-mobility thin InSb films grown by molecular beam epitaxyT. Zhang; S. K. Clowes; M. Debnath; A. Bennett; C. Roberts; J. J. Harris; R. A. Stradling; L. F. Cohen; T. Lyford; P. F. Fewster · 2004