Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry
- 作者L.X. Yang; W. Steinchen; M. Schuth; G. Kupfer
- 卷第16卷
- 期第3期
- 印刷ISSN0263-2241
- 文件大小878.43KB
- 发表时间1995
- DOI10.1016/0263-2241(95)00020-0
- 页码149-160
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