Book reviews
- 期刊名称Asian Studies Review
- 作者Eccles, Lance; Wan, Shuping; Gao, Mobo C. F.; Edwards, Louise; Woodward, Dennis; Liew, Leong; Sigley, Gary; Svensson, Martin; Mackerras, Colin; Cotton, James; Low, Morris; Roces, Mina; Crouch, Harold; Sullivan, Patrick; Stuart‐Fox, Martin; Parker, Lynette
- 卷第22卷
- 期第1期
- 印刷ISSN1035-7823
- 电子ISSN1467-8403
- 文件大小2682.40KB
- 发表时间1998-03
- DOI10.1080/10357829808713189
- 页码99-136
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Reliable tantalum-gate fully-depleted-SOI MOSFET technology featuring low-temperature processingUshiki, T.; Mo-Chiun Yu; Hirano, Y.; Shimada, H.; Morita, M.; Ohmi, T. · 1997
[IEEE International Electron Devices Meeting - Washington, DC, USA (10-13 Dec. 1995)] Proceedings of International Electron Devices Meeting - Threshold voltage adjustment in SOI MOSFETs by employing tantalum for gate materialShimada, H.; Hirano, Y.; Ushiki, T.; Ohmi, T. · 1995