![SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Photorefractive Materials: Phenomena and Related Applications II - <title>New method for identification of impurity levels in photorefractive crystals</title>]()
SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Photorefractive Materials: Phenomena and Related Applications II - <title>New method for identification of impurity levels in photorefractive crystals</title>Song, Hongwei; Chi, Mingjun; Dou, Shuoxing; Zhu, Yong; Ye, Peixian; Ye, Peixian; Shimura, Tsutomu; Neurgaonkar, Ratnakar R. · 1998