Guidelines for authors
- 期刊名称European Journal of General Practice
- 卷第7卷
- 期第3期
- 印刷ISSN1381-4788
- 电子ISSN1751-1402
- 文件大小154.48KB
- 发表时间2001-01
- DOI10.3109/13814780109080871
- 页码111-111
MEMS Reliability ReviewHuang, Yunhan; Sai Sarathi Vasan, Arvind; Doraiswami, Ravi; Osterman, Michael; Pecht, Michael · IEEE Transactions on Device and Materials Reliability · 2012
Design for soft error mitigationNicolaidis, M. · IEEE Transactions on Device and Materials Reliability · 2005
ErratumBrennan, Claire; Draksharapu, Apparao; Browne, Wesley R.; McGarvey, John J.; Vos, Johannes G.; Pryce, Mary T. · IEEE Transactions on Device and Materials Reliability · 2005
Fuse Regrowth KineticsLambert, D.; Gannamani, R.; Blish, R.C. · IEEE Transactions on Device and Materials Reliability · 2004
Author's replyMiranda, E. · IEEE Transactions on Device and Materials Reliability · 2006
Timing Vulnerability Factors of SequentialsSeifert, N.; Tam, N. · IEEE Transactions on Device and Materials Reliability · 2004
Popcorn Cavity PressureShirley, C. Glenn · IEEE Transactions on Device and Materials Reliability · 2014
Device ArchitectureTao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob · IEEE Transactions on Device and Materials Reliability · 2007