BOOK REVIEWS
- 期刊名称Measurement in Physical Education and Exercise Science
- 作者Darracott, Shirley; Motl, Robert W.
- 卷第7卷
- 期第3期
- 印刷ISSN1091-367X
- 电子ISSN1532-7841
- 文件大小61.79KB
- 发表时间2003-09
- DOI10.1207/S15327841MPEE0703_05
- 页码199-204
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Topological testingMalek, M.; Mourad, A.; Pandya, M. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Twenty years of ATEGosling, W. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - 'ATG' test generation softwareDowney, A.E. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - R96MFX test strategyMann, W.R. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - The economics of scan designLevitt, M.E. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - A BIST design methodology experimentDuncan, S.H. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Process monitoring oriented IC testingMaly, W.; Naik, S.B. · 1989
[IEEE Comput. Soc. Press Proceedings. 'Meeting the Tests of Time'., International Test Conference - Washington, DC, USA (29-31 Aug. 1989)] Proceedings. 'Meeting the Tests of Time'., International Test Conference - Diagnostics based on faulty signatureChan, J.C.; Womack, B.F. · 1989