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[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

[AIP SCANNING TUNNELING MICROSCOPY/SPECTROSCOPY AND RELATED TECHNIQUES: 12th International Conference STM'03 - Eindhoven (NETHERLANDS) (21-25 July 2003)] AIP Conference Proceedings - Ballistic Electron Emission Spectroscopy Used as a Tool for Determining Accurate Hot-Electron Lifetimes in Metals

de Pablos, P. F.
  • 作者de Pablos, P. F.
  • 卷第696卷
  • 文件大小278.12KB
  • 发表时间2003
  • DOI10.1063/1.1639790
  • 页码829-836
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