[IEEE CCECE 2003 - Canadian Conference on Electrical and Computer Engineering. Toward a Caring and Humane Technology - Montreal, Que., Canada (4-7 May 2003)] CCECE 2003 - Canadian Conference on Electrical and Computer Engineering. Toward a Caring and Humane Technology (Cat. No.03CH37436) - Safe probe for high electric field measurements
Barthod, C.; Passard, M.; Galez, C.; Bouillot, J.; Farzaneh, M.; Volat, C.; Teisseyre, Y.
- 作者Barthod, C.; Passard, M.; Galez, C.; Bouillot, J.; Farzaneh, M.; Volat, C.; Teisseyre, Y.
- 卷第1卷
- 文件大小284.34KB
- 发表时间2003
- DOI10.1109/ccece.2003.1226475
- 页码635-638