![[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Multiple-parameter CMOS IC testing with increased sensitivity for I/sub DDQ/]()
[Int. Test Conference International Test Conference 2000 - Atlantic City, NJ, USA (3-5 Oct. 2000)] Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Multiple-parameter CMOS IC testing with increased sensitivity for I/sub DDQ/Keshavarzi, A.; Roy, K.; Sachdev, M.; Hawkins, C.F.; Soumyanath, K.; De, V. · 2000