![[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability accelerated testing method based on test coverage]()
[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability accelerated testing method based on test coverageWang, Shuanqi; Wu, Yumei; Lu, Minyan; Li, Haifeng · 2011