[IEEE Digest of Papers. 2004 International Microprocesses and Nanotechnology Conference, 2004. - Osaka, Japan (2004.10.26-2004.10.29)] Digest of Papers. 2004 International Microprocesses and Nanotechnology Conference, 2004. - Fine fabrication of gainasp-inp photonic crystal by Hi/Xe ICP etching using electron beam resist mask
- 作者Fujita, M.; Sugitatsu, A.; Uesugi, T.; Noda, S.
- 文件大小402.13KB
- 发表时间2004
- DOI10.1109/imnc.2004.245637
- 页码344-345
[IEEE Technical Digest of the 18th International Vacuum Nanoelectronics Conference - Oxford, UK (10-14 July 2005)] 2005 International Vacuum Nanoelectronics Conference - Fabrication of gated cold cathode using standing thin film induced by ion-beam bombardmentYoshida, T.; Baba, A.; Asano, T. · 2005
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Field emission characteristics of defect-controlled polyimide tunneling cathodeBaba, A.; Yoshida, T.; Asano, T. · 2003
Dietary magnesium intake and risk of incident coronary heart disease in men: A prospective cohort studyKokubo, Yoshihiro; Saito, Isao; Iso, Hiroyasu; Yamagishi, Kazumasa; Yatsuya, Hiroshi; Ishihara, Junko; Maruyama, Koutatsu; Inoue, Manami; Sawada, Norie; Tsugane, Shoichiro; Tsugane, S.; Sawada, N.; Iwasaki, M.; Sasazuki, S.; Yamaji, T.; Shimazu, T.; Hanaoka, T.; Ogata, J.; Baba, S.; Mannami, T.; Okayama, A.; Kokubo, Y.; Miyakawa, K.; Saito, F.; Koizumi, A.; Sano, Y.; Hashimoto, I.; Ikuta, T.; Tanaba, Y.; Sato, H.; Roppongi, Y.; Takashima, T.; Suzuki, H.; Miyajima, Y.; Suzuki, N.; Nagasawa, S.; Furusugi, Y.; Nagai, N.; Ito, Y.; Komatsu, S.; Minamizono, T.; Sanada, H.; Hatayama, Y.; Kobayashi, F.; Uchino, H.; Shirai, Y.; Kondo, T.; Sasaki, R.; Watanabe, Y.; Miyagawa, Y.; Kobayashi, Y.; Machida, M.; Kobayashi, K.; Tsukada, M.; Kishimoto, Y.; Takara, E.; Fukuyama, T.; Kinjo, M.; Irei, M.; Sakiyama, H.; Imoto, K.; Yazawa, H.; Seo, T.; Seiko, A.; Ito, F.; Shoji, F.; Saito, R.; Murata, A.; Minato, K.; Motegi, K.; Fujieda, T.; Yamato, S.; Matsui, K.; Abe, T.; Katagiri, M.; Suzuki, M.; Doi, M.; Terao, A.; Ishikawa, Y.; Tagami, T.; Sueta, H.; Doi, H.; Urata, M.; Okamoto, N.; Ide, F.; Goto, H.; Fujita, R.; Onga, N.; Takaesu, H.; Uehara, M.; Nakasone, T.; Yamakawa, M.; Horii, F.; Asano, I.; Yamaguchi, H.; Aoki, K.; Maruyama, S.; Ichii, M.; Takano, M.; Tsubono, Y.; Suzuki, K.; Honda, Y.; Yamagishi, K.; Sakurai, S.; Tsuchiya, N.; Kabuto, M.; Yamaguchi, M.; Matsumura, Y.; Sasaki, S.; Watanabe, S.; Akabane, M.; Kadowaki, T.; Inoue, M.; Noda, M.; Mizoue, T.; Kawaguchi, Y.; Takashima, Y.; Yoshida, Y.; Nakamura, K.; Takachi, R.; Ishihara, J.; Matsushima, S.; Natsukawa, S.; Shimizu, H.; Sugimura, H.; Tominaga, S.; Hamajima, N.; Iso, H.; Sobue, T.; Iida, M.; Ajiki, W.; Ioka, A.; Sato, S.; Maruyama, E.; Konishi, M.; Okada, K.; Saito, I.; Yasuda, N.; Kono, S.; Akiba, S.; Isobe, T. · Clinical Nutrition · 2017
[Japan Soc. Promotion of Sci International Vacuum Microelectronics Conference - Osaka, Japan (7-11 July 2003)] IEEE/CPMT/SEMI. 28th International Electronics Manufacturing Technology Symposium (Cat. No.03CH37479) - Self-aligned fabrication of gated organic nano-pillar cold cathodeBaba, A.; Yoshida, T.; Asano, T. · 2003
[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - Feasibility of inkjet printing for field electron emitter fabricationBaba, A.; Ishida, Y.; Yoshida, T.; Hakiai, K.; Matsuzaki, K.; Asano, T. · 2004
[Japan Soc. Appl. Phys Digest of Papers. Microprocesses and Nanotechnology 2002. 2002 International Microprocesses and Nanotechnology Conference - Tokyo, Japan (6-8 Nov. 2002)] 2002 International Microprocesses and Nanotechnology Conference, 2002. Digest of Papers. - Micro field emitter with nano-pillarets formed by RIE of photoresistBaba, A.; Yoshida, T.; Asano, T. · 2002
[IEEE Technical Digest of the 17th International Vacuum Nanoelectronics Conference - Cambridge, MA, USA (11-16 July 2004)] Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) - Ultra-high electron emission efficiency from defect controlled polyimide tunnel cathodeBaba, A.; Yoshida, T.; Asano, T. · 2004