![SPIE Proceedings [SPIE Security + Defence - Toulouse, France (Monday 20 September 2010)] Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV - The manufacturing and testing of Cs 2 Te UV image intensifier]()
SPIE Proceedings [SPIE Security + Defence - Toulouse, France (Monday 20 September 2010)] Electro-Optical Remote Sensing, Photonic Technologies, and Applications IV - The manufacturing and testing of Cs 2 Te UV image intensifierFu, Rongguo; Kamerman, Gary W.; Steinvall, Ove; Chang, Benkang; Qian, Yuansheng; Lewis, Keith L.; Hollins, Richard C.; Qiu, Yafeng; Merlet, Thomas J.; Bishop, Gary J.; Gonglewski, John D. · 2010