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[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - The compact Tesla transformer for testing pin insulatorPungsiri, B.; Chotigo, S. · 2008
[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - The effect of atmospheric factor on various test gaps under negative impulse voltagesChotigo, S.; Pungsiri, B.; Kanchana, S. · 2008