![[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - A SW performance estimation framework for early system-level-design using fine-grained instrumentation]()
[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - A SW performance estimation framework for early system-level-design using fine-grained instrumentationKempf, T.; Karuri, K.; Wallentowitz, S.; Ascheid, G.; Leupers, R.; Meyr, H. · 2006